A400GE-QDD 400GE

DATA SHEETS

A400GE-QDD 400GE Test System

For 400GE technologies, the challenge has become characterizing and quantifying the actual bit error rate (BER) and forward error correction (FEC) performance of silicon devices, application-specific integrated circuits (ASICs), fiber and copper interconnects, optical transceivers, and the port electronics of switches and routers. Identifying 400GE BER and FEC problems quickly is critical as answers are complex and time-consuming to solve.

Read this data sheet to understand how Ixia’s A400GE-QDD test system makes the challenge of qualifying BER on 400GE electronics easier and affordable. With this dedicated BERT and FEC test system with 56Gb/s electrical lane signaling per port, you'll find problems in minutes, not hours.